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Forces on Small Scales – Liwei Chen

Date: Mon. April 25th, 2005, 12:30 pm-1:30 pm
Location: Rockefeller 221

Atomic Force Microscopy (AFM) has become an indispensable tool in nanoscience and nanotechnology. In this talk, I will not only show routine application of topographical imaging with nanometer resolution, but also demonstrate further studies that benefit from quantitative measurements of small forces. Examples include complete force profiles between SAMs, interfacial electric dipole, and energy level alignment in organic thin-film-transistors.

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